This International Standard defines a conceptual schema for observations, and for features involved in sampling
when making observations. These provide models for the exchange of information describing observation acts
and their results, both within and between different scientific and technical communities.
Observations commonly involve sampling of an ultimate feature-of-interest. This International Standard defines
a common set of sampling feature types classified primarily by topological dimension, as well as samples for
ex-situ observations. The schema includes relationships between sampling features (sub-sampling, derived
samples).
This International Standard concerns only externally visible interfaces and places no restriction on the underlying
implementations other than what is needed to satisfy the interface specifications in the actual situation.