Semiconductor devices - Mechanical and climatic test methods -- Part 12: Vibration, variable frequency ((IEC 60749-12:2017) EN IEC 60749-12:2018) (english version)
This part of IEC 60749 describes a test to determine the effect of variable frequency vibration,
within the specified frequency range, on internal structural elements. This is a destructive test.
It is normally applicable to cavity-type packages.
ICS
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом
