This part of IEC 60512, when required by the detail specification, is used for testing
connectors within the scope of IEC technical committee 48. It may also be used for similar
devices when specified in a detail specification.
The object of this standard is to define a standard test method to assess the possibility of
whisker growth by external mechanical stress on the tin and tin-alloy plated parts of a
connector in its application (after wire termination, after soldering, after mounting, mated with
counterpart).
This standard does not cover internal stress type whisker.
While for internal stress type whisker, it is possible to apply accelerated test conditions, e.g.:
by damp heat or temperature cycling, for the external mechanical stress type whisker covered
by this standard, due to the different whisker generation mechanism, there are no accelerated
conditions. The test detailed in this standard shall then be conducted under normal ambient
conditions.