ÖVE/ÖNORM EN 60749-27:2013-07

Действует

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006 + A1:2012) (english version)

Описание Изменения Ссылки Версии

Ссылочные документы

IEC 60749-26:2003 ed1.0

Заменен

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) — 27 стр.

IEC 61340-3-2:2006 ed2.0

Отменен

Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms — 19 стр.

BS EN 61340-3-2:2002

Заменен

Electrostatics. Methods for simulation of electrostatic effects, Machine model (MM). Component testing — 12 стр.

BS EN 60749-26:2006

Заменен

Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM) — 18 стр.