This International Standard specifies the testing and measurement of water vapour and other
gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test
is used as a measure of the quality of the sealing process and to provide information about
the long-term chemical stability of the atmosphere inside the package. It is applicable to
semiconductor devices sealed in such a manner but generally only used for high reliability
applications such as military or aerospace. This test is destructive.