ÖVE/ÖNORM EN 62047-4:2011-05

Действует

Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS (IEC 62047-4:2008) (english version)

Описание Изменения Ссылки Версии

Ссылочные документы

IEC 60617-3:1983 ed1.0

Заменен

Graphical symbols for diagrams. Part 3: Conductors and connecting devices. — 13 стр.

IEC 60747-1:2006 ed2.0

Действует

Semiconductor devices - Part 1: General — 89 стр.

IEC 61193-2:2007 ed1.0

Действует

Quality assessment systems - Part 2: Selection and use of sampling plans for inspection of electronic components and packages — 18 стр.

IEC 62047-1:2016 ed2.0

Действует

Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions — 66 стр.

BS ISO 1000:1992

Заменен

SI units and recommendations for the use of their multiples and of certain other units — 30 стр.

ISO 2859-1:1999/Amd.1:2011

Действует

Sampling procedures for inspection by attributes -- Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection -- Amendment 1 — 8 стр.

BS EN 61193-2:2007

Действует

Quality assessment systems. Selection and use of sampling plans for inspection of electronic components and packages — 22 стр.

BS EN 62047-1:2016

Действует

Semiconductor devices. Micro-electromechanical devices. Terms and definitions — 36 стр.