SAE J1752/2_199503

Заменен

ELECTROMAGNETIC COMPATIBILITY MEASUREMENT PROCEDURES FOR INTEGRATED CIRCUITS—INTEGRATED CIRCUIT RADIATED EMISSIONS DIAGNOSTIC PROCEDURE 1 MHZ TO 1000 MHZ, MAGNETIC FIELD—LOOP PROBE

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Заменен

Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz