SAE J1752/3

Заменен

Measurement of Radiated Emissions from Integrated CircuitsâTEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)

Описание Изменения Ссылки Версии

Тематика

Integrated circuits

Radiation

Tests and Testing

Electrical systems

Electromagnetic compatibility