SAE J1752/3_200301

Заменен

Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)

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SAE J1752/3_199503

Заменен

ELECTROMAGNETIC COMPATIBILITY MEASUREMENT PROCEDURES FOR INTEGRATED CIRCUITS—INTEGRATED CIRCUIT RADIATED EMISSIONS MEASUREMENT PROCEDURE 150 KHZ TO 1000 MHZ, TEM CELL

IEC 61967-8:2023 ed2.0

Действует

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method — 34 стр.

SAE J1752/1_202109

Действует

Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions (Stabilized: Sep 2021)

На этот документ ссылаются

SAE J1752/3_199503

Заменен

ELECTROMAGNETIC COMPATIBILITY MEASUREMENT PROCEDURES FOR INTEGRATED CIRCUITS—INTEGRATED CIRCUIT RADIATED EMISSIONS MEASUREMENT PROCEDURE 150 KHZ TO 1000 MHZ, TEM CELL