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SAE J1752/3_200301

Заменен
Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)
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Ссылочные документы

IEC 61967-8:2023 ed2.0
Действует
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method — 34 стр.
SAE J1752/1_202109
Действует
Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions (Stabilized: Sep 2021)
SAE J1752/3
Заменен
Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)
SAE J1752/3_199503
Заменен
ELECTROMAGNETIC COMPATIBILITY MEASUREMENT PROCEDURES FOR INTEGRATED CIRCUITS—INTEGRATED CIRCUIT RADIATED EMISSIONS MEASUREMENT PROCEDURE 150 KHZ TO 1000 MHZ, TEM CELL

На этот документ ссылаются

SAE J1752/3
Заменен
Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)
SAE J1752/3_199503
Заменен
ELECTROMAGNETIC COMPATIBILITY MEASUREMENT PROCEDURES FOR INTEGRATED CIRCUITS—INTEGRATED CIRCUIT RADIATED EMISSIONS MEASUREMENT PROCEDURE 150 KHZ TO 1000 MHZ, TEM CELL