This specification establishes the requirements and test procedures for automotive miniature bulb retention devices, including wedge base sockets with integral connector, direct wire wedge base sockets, circuit plate assemblies, and associated interfaces. Tests shall follow the sequence shown in the flow charts in Appendix E whenever the following occurs:

• New design
• Design, material or process change made to an existing device, which could affect the outcome of the test.

Tests marked ‘Yearly’ in the following Test Schedule Table shall be run annually. Each test shall be run on 10 samples minimum; tests may be grouped, as supplier prefers, to reduce sample quantity or facilitate scheduling. Production process control data collected at a shorter interval per an approved control plan, may substituted if approved by customer’s responsible engineer and purchasing representative.