Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics— 28 стр.
Standard Guide for Use of an X-Ray Tester ("48;10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits— 18 стр.