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ASTM E2244-11

Заменен
Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer — 11 стр.
ОписаниеСсылкиВерсии

Ссылочные документы

ASTM E2245-11
Заменен
Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer — 24 стр.
ASTM E2246-11
Заменен
Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer — 21 стр.
ASTM E2444-11e1
Заменен
Terminology Relating to Measurements Taken on Thin, Reflecting Films — 2 стр.
ASTM E2530-06
Отменен
Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps (Withdrawn 2015) — 6 стр.
ASTM E2244-11e1
Заменен
Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer — 14 стр.
ASTM E2244-05
Заменен
Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer — 11 стр.

На этот документ ссылаются

ASTM E2444-11
Заменен
Terminology Relating to Measurements Taken on Thin, Reflecting Films — 2 стр.
ASTM E2444-05e1
Заменен
Terminology Relating to Measurements Taken on Thin, Reflecting Films — 3 стр.
ASTM E2246-11
Заменен
Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer — 21 стр.
ASTM E2244-05
Заменен
Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer — 11 стр.
ASTM E2245-11
Заменен
Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer — 24 стр.
ASTM E2246-05
Заменен
Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer — 16 стр.
ASTM E2244-11e1
Заменен
Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer — 14 стр.