ASTM E2245-11

Заменен

Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer — 24 стр.

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Ссылочные документы

ASTM E2246-11

Заменен

Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer — 21 стр.

ASTM E2444-11e1

Заменен

Terminology Relating to Measurements Taken on Thin, Reflecting Films — 2 стр.

ASTM E2530-06

Отменен

Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps (Withdrawn 2015) — 6 стр.

ASTM E2244-11

Заменен

Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer — 11 стр.

ASTM E2245-11e1

Заменен

Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer — 25 стр.

ASTM E2245-05

Заменен

Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer — 20 стр.

На этот документ ссылаются

ASTM E2444-11

Заменен

Terminology Relating to Measurements Taken on Thin, Reflecting Films — 2 стр.

ASTM E2444-05e1

Заменен

Terminology Relating to Measurements Taken on Thin, Reflecting Films — 3 стр.

ASTM F2603-06

Заменен

Standard Guide for Interpreting Images of Polymeric Tissue Scaffolds — 9 стр.

ASTM E2244-11

Заменен

Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer — 11 стр.

ASTM E2246-11

Заменен

Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer — 21 стр.

ASTM E2245-11e1

Заменен

Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer — 25 стр.

ASTM E2245-05

Заменен

Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer — 20 стр.

ASTM E2246-05

Заменен

Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer — 16 стр.