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ASTM E722-14

Заменен
Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics — 27 стр.
ОписаниеСсылкиВерсии

Ссылочные документы

ASTM E170-17
Заменен
Standard Terminology Relating to Radiation Measurements and Dosimetry — 12 стр.
ASTM E844-18
Действует
Standard Guide for Sensor Set Design and Irradiation for Reactor Surveillance — 8 стр.
ASTM E265-15
Заменен
Standard Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32 — 6 стр.
ASTM E721-16
Заменен
Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics — 12 стр.
ASTM E693-17
Заменен
Standard Practice for Characterizing Neutron Exposures in Iron and Low Alloy Steels in Terms of Displacements Per Atom (DPA) — 8 стр.
ASTM E720-16
Заменен
Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics — 12 стр.
ASTM E944-13e1
Заменен
Standard Guide for Application of Neutron Spectrum Adjustment Methods in Reactor Surveillance — 8 стр.
ASTM E722-19
Действует
Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics — 28 стр.
ASTM E722-09e1
Заменен
Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics — 27 стр.

На этот документ ссылаются

18/30373809 DC
Действует
BS EN 60749-17. Semiconductor devices. Mechanical and climatic test methods. Part 17. Neutron irradiation — 10 стр.
ASTM E1855-10
Заменен
Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors — 10 стр.
ASTM E722-09e1
Заменен
Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics — 27 стр.
ASTM E1918-06(2015)
Заменен
Standard Test Method for Measuring Solar Reflectance of Horizontal and Low-Sloped Surfaces in the Field — 4 стр.
ASTM E1918-06
Заменен
Standard Test Method for Measuring Solar Reflectance of Horizontal and Low-Sloped Surfaces in the Field — 3 стр.
ASTM E261-10
Заменен
Standard Practice for Determining Neutron Fluence, Fluence Rate, and Spectra by Radioactivation Techniques — 14 стр.
ASTM E261-15
Заменен
Standard Practice for Determining Neutron Fluence, Fluence Rate, and Spectra by Radioactivation Techniques — 14 стр.
ASTM E721-11
Заменен
Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics — 11 стр.
ASTM E2450-11
Заменен
Standard Practice for Application of CaF<sub>2</sub>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments — 6 стр.
ASTM F980-10e1
Заменен
Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices — 7 стр.
ASTM E170-16
Заменен
Standard Terminology Relating to Radiation Measurements and Dosimetry — 12 стр.
ASTM E170-16a
Заменен
Standard Terminology Relating to Radiation Measurements and Dosimetry — 12 стр.
ASTM E170-14a
Заменен
Standard Terminology Relating to Radiation Measurements and Dosimetry — 10 стр.
ASTM E170-15a
Заменен
Standard Terminology Relating to Radiation Measurements and Dosimetry — 11 стр.
ASTM E170-15
Заменен
Standard Terminology Relating to Radiation Measurements and Dosimetry — 10 стр.
ASTM E170-14
Заменен
Standard Terminology Relating to Radiation Measurements and Dosimetry — 10 стр.
ASTM E170-10
Заменен
Standard Terminology Relating to Radiation Measurements and Dosimetry — 9 стр.
ASTM E722-19
Действует
Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics — 28 стр.
ASTM F1190-11
Заменен
Standard Guide for Neutron Irradiation of Unbiased Electronic Components — 6 стр.