Каталог стандартов

+7 (495) 223-46-76 +7 (812) 309-78-59
inform@normdocs.ru
О компании Стандарты Контакты Заказать стандарт
СтандартыASTM

ASTM F1451-92(1999)

Отменен
Standard Test Method for Measuring Sori on Silicon Wafers by Automated Noncontact Scanning (Withdrawn 2003) — 12 стр.
ОписаниеСсылкиВерсии

Ссылочные документы

ASTM F1451-92(1999)
Отменен
Standard Test Method for Measuring Sori on Silicon Wafers by Automated Noncontact Scanning (Withdrawn 2003) — 12 стр.

На этот документ ссылаются

DIN 50441-5:1998-05
Отменен
Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 5: Terms of shape and flatness deviation — 10 стр.
DIN 50441-5:2001-04
Отменен
Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 5: Terms of shape and flatness deviation — 11 стр.
ASTM F1451-92(1999)
Отменен
Standard Test Method for Measuring Sori on Silicon Wafers by Automated Noncontact Scanning (Withdrawn 2003) — 12 стр.