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ASTM
ASTM F1893-18
Отменен
Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices (Withdrawn 2023)
— 7 стр.
Описание
Ссылки
Версии
Ссылочные документы
ASTM F526-21
Действует
Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines
— 13 стр.
ASTM E170-24
Действует
Standard Terminology Relating to Radiation Measurements and Dosimetry
— 12 стр.
ASTM E668-20
Действует
Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
— 19 стр.
ASTM E1894-24
Действует
Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources
— 19 стр.
ASTM F1893-18
Отменен
Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices (Withdrawn 2023)
— 7 стр.
ASTM F1893-11
Заменен
Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
— 7 стр.
На этот документ ссылаются
ASTM F867M-94A
Заменен
Guide for Ionizing Radiation Effects (Total Dose) Testing of Semiconductor Devices [Metric] (Withdrawn 1998)
— 7 стр.
ASTM F1262M-14
Отменен
Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) (Withdrawn 2023)
— 6 стр.
ASTM F1893-98(2003)
Заменен
Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices
— 5 стр.
ASTM F1893-11
Заменен
Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
— 7 стр.
ASTM F1893-98
Заменен
Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices
— 5 стр.
ASTM F1893-18
Отменен
Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices (Withdrawn 2023)
— 7 стр.