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СтандартыASTM

ASTM F219-96(2013)

Заменен
Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps — 3 стр.
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Ссылочные документы

ASTM F16-12(2017)
Заменен
Standard Test Methods for Measuring Diameter or Thickness of Wire and Ribbon for Electronic Devices and Lamps — 5 стр.
ASTM F205-94(2015)
Заменен
Standard Test Method for Measuring Diameter of Fine Wire by Weighing — 3 стр.
ASTM F289-96(2014)
Заменен
Standard Specification for Molybdenum Wire and Rod for Electronic Applications — 4 стр.
ASTM B63-07(2013)
Заменен
Standard Test Method for Resistivity of Metallically Conducting Resistance and<brk/> Contact Materials — 4 стр.
ASTM D374-99(2004)
Заменен
Standard Test Methods for Thickness of Solid Electrical Insulation (Withdrawn 2013) — 11 стр.
ASTM F219-96(2018)
Отменен
Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps (Withdrawn 2023) — 3 стр.
ASTM F219-96(2009)
Заменен
Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps — 3 стр.

На этот документ ссылаются

ASTM F487-13
Заменен
Standard Specification for Fine Aluminum–;1 ;% Silicon Wire for Semiconductor Lead-Bonding — 4 стр.
ASTM F288-96(2009)
Заменен
Standard Specification for Tungsten Wire for Electron Devices and Lamps — 5 стр.
ASTM F73-96(2013)
Заменен
Standard Specification for Tungsten-Rhenium Alloy Wire for Electron Devices and Lamps — 3 стр.
ASTM F289-96(2009)
Заменен
Standard Specification for Molybdenum Wire and Rod for Electronic Applications — 4 стр.
ASTM F72-06
Заменен
Standard Specification for Gold Wire for Semiconductor Lead Bonding (Withdrawn 2015) — 11 стр.
ASTM F219-96(2009)
Заменен
Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps — 3 стр.
ASTM F219-96(2018)
Отменен
Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps (Withdrawn 2023) — 3 стр.