ASTM F744M-10

Заменен

Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric] — 7 стр.

Ссылочные документы

Заменен

Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices — 19 стр.

ASTM E665-94

Отменен

Practice for Using Absorbed Dose Versus Depth in Materials to Verify the X-ray Output of Flash X-ray Machines (Withdrawn 2000) — 4 стр.

ASTM F526-11

Заменен

Standard Test Method for Measuring Dose for Use in Linear Accelerator Pulsed Radiation Effects Tests — 12 стр.

ASTM E666-14

Заменен

Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation — 9 стр.

ASTM E1894-13a

Заменен

Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources — 19 стр.

ASTM F744M-16

Отменен

Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) (Withdrawn 2023) — 7 стр.

ASTM F744M-97(2003)

Заменен

Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric] — 6 стр.

На этот документ ссылаются

ASTM F744M-97(2003)

Заменен

Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric] — 6 стр.

ASTM F744M-16

Отменен

Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) (Withdrawn 2023) — 7 стр.