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ASTM F76-08(2016)

Заменен
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors — 14 стр.
ОписаниеСсылкиВерсии

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ASTM F76-08(2016)e1
Отменен
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors (Withdrawn 2023) — 14 стр.
ASTM F76-08
Заменен
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors — 14 стр.

На этот документ ссылаются

ASTM F76-08
Заменен
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors — 14 стр.
ASTM F76-08(2016)e1
Отменен
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors (Withdrawn 2023) — 14 стр.