Harmonized system of quality assessment for electric components. Varistors for use in electronic equipment. Sectional specification for surge suppression varistors— 20 стр.
Harmonized system of quality assessment for electronic components. Generic specification. Radio frequency coaxial connectors (Parts I, II and III)— 96 стр.
Harmonized system of quality assessment for electronic components. Blank detail specification: electromechanical all-or-nothing heavy load relays of assessed quality (hermetically sealed, 5A to 25A)— 30 стр.
Electromechanical components for electronic equipment. Basic testing procedures and measuring methods. Soldering tests. Test 12f. Sealing against flux and cleaning solvents in machine soldering— 14 стр.
Harmonized system of quality assessment for electronic components. Generic specification: variable capacitors. (Qualification approval and capability approval)— 40 стр.
Harmonized system of quality assessment for electronic components. Electrical relays. Generic specification: electromechanical all-or-nothing relays. Test and measurement procedures— 52 стр.
Harmonized system of quality assessment for electronic components. Capability detail specification: flexible printed boards with through-connections— 16 стр.
Harmonized system of quality assessment for electronic components: Sectional specification: Single and double sided printed boards with plated through holes— 32 стр.
Harmonized system of quality assessment for electronic components. Capability detail specification: flexible printed boards without through-connections— 18 стр.
Harmonized system of quality assessment for electronic components. Sectional specification. Flex-rigid double sided printed boards with through connections— 38 стр.
Harmonized system of quality assessment for electronic components. Sectional specification: flexible printed boards without through connections— 30 стр.
Specification for harmonized system of quality assessment for electronic components. Sectional specification: flexible printed boards with through connections— 34 стр.
Harmonized system of quality assessment for electronic components. Sectional specification. Flexible multilayer printed boards with through connections— 50 стр.
Harmonized system of quality assessment for electronic components. Sectional specification. Flex-rigid multilayer printed boards with through connections— 50 стр.
Harmonized system of quality assessment for electronic components: Sectional specification: Single and double sided printed boards with plain holes— 26 стр.
Specification for electric cables for general airframe or equipment interconnect use (150$0DC), wrapped insulation with silver plated conductors— 22 стр.
Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, 47 U/2, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level— 16 стр.
Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level— 12 стр.
Detail specification for single turn low power non-wirewound rotary potentiometers. Spindle insulated from resistance element, spindle and panel sealed or container, spindle and panel sealed. Full assessment level— 24 стр.
Detail specification for multi-contact circular electrical connectors for d.c. and low frequency applications. Bayonet couplingnon-barrier sealed, environment resistant with rear insertable, rear release, rear removable crimp contacts also barrier sealedwith non-removable solder contact styles. Full plus airframe fit assessment— 126 стр.
Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level— 12 стр.
Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level— 14 стр.
Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, 47 U/2, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level— 14 стр.
Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level— 12 стр.
Detail specification for cold welded seal quartz crystal units for oscillator applications. DK enclosure, 6.0 to 25 MHz frequency range. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level— 12 стр.
Specification for electrical connectors of assessed quality for d.c. and low frequency application: generic data, methods of test and capability approval procedures— 94 стр.
Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level— 14 стр.
Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level— 12 стр.
Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level— 12 стр.
Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures). Generic data and methods of test— 154 стр.
Specification for capability approval of manufacturers of passive radio interference suppression filter units of assessed quality generic data— 26 стр.
Detail specification for resistance welded seal quartz crystal units for oscillator applications. DN, DZ, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level— 12 стр.
Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level— 12 стр.
System of quality assessment. Capability detail specification. Flexible single-sided and double-sided printed boards without through-connections— 34 стр.
