BS EN 60749-13:2002

Заменен

Semiconductor devices. Mechanical and climatic test methods. Salt atmosphere — 10 стр.

Ссылочные документы

Действует

Environmental testing. Test methods. Tests. Test KA. Salt mist — 10 стр.

Заменен

Basic environmental testing procedures for electronic components and electronic equipment - Part 2:Tests - Test Ka: Salt mist — 4 стр.

Действует

Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity) — 27 стр.

Действует

Semiconductor devices. Mechanical and climatic test methods. Salt atmosphere — 20 стр.

Действует

Semiconductor devices. Mechanical and climatic test methods. Salt atmosphere — 20 стр.

Заменен

Semiconductor devices. Mechanical and climatic test methods — 80 стр.