BS EN 60749-14:2003

Действует

Semiconductor devices. Mechanical and climatic test methods. Robustness of terminations (lead integrity) — 18 стр.

Ссылочные документы

Действует

Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing — 0 стр.

Действует

Semiconductor devices. Mechanical and climatic test methods. Sealing — 20 стр.

Заменен

Discrete semiconductor devices. Isolated power semiconductor devices — 56 стр.

Действует

Semiconductor devices. Mechanical and climatic test methods. Salt atmosphere — 20 стр.

Действует

Organic light emitting diode (OLED) panels for general lighting. Performance requirements — 30 стр.

Действует

Liquid crystal display devices. Environmental, endurance and mechanical test methods. Mechanical — 14 стр.

Заменен

Semiconductor devices. Mechanical and climatic test methods — 80 стр.

Действует

Liquid crystal display devices - Part 10-1: Environmental, endurance and mechanical test methods - Mechanical (IEC 61747-10-1:2013) (english version)