BS EN 60749-40:2011

Действует

Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using a strain gauge — 26 стр.

Ссылочные документы

Заменен

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer — 39 стр.

Действует

Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using an accelerometer — 22 стр.