Semiconductor devices. Mechanical and climatic test methods. Neutron beam irradiated single event effect (SEE) test method for semiconductor devices— 24 стр.
Process management for avionics. Atmospheric radiation effects. Design of high voltage aircraft electronics managing potential single event effects— 18 стр.
Process management for avionics. Atmospheric radiation effects. Assessment of thermal neutron fluxes and single event effects in avionics systems— 24 стр.
