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BS EN IEC 62435-6:2018

Действует
Electronic components. Long-term storage of electronic semiconductor devices. Packaged or finished devices — 22 стр.
ОписаниеИзмененияСсылкиВерсии

Ссылочные документы

IEC 62435-4:2018 ed1.0
Действует
Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage — 20 стр.
BS EN IEC 62435-4:2018
Действует
Electronic components. Long-term storage of electronic semiconductor devices. Storage — 26 стр.
BS EN IEC 60721-3-1:2018
Действует
Classification of environmental conditions. Classification of groups of environmental parameters and their severities. Storage — 18 стр.
BS EN 62435-2:2017
Действует
Electronic components. Long-term storage of electronic semiconductor devices. Deterioration mechanisms — 24 стр.
IEC 62435-5:2017 ed1.0
Действует
Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices — 42 стр.
IEC 60749-20-1:2009 ed1.0
Заменен
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat — 63 стр.
BS EN 60749-20-1:2009
Действует
Semiconductor devices. Mechanical and climatic test methods. Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat — 36 стр.
IEC 60749-20:2002/COR1:2003 ed1.0
Заменен
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat — 0 стр.
IEC 62435-6:2018 ed1.0
Действует
Electronic components - Long-term storage of electronic semiconductor devices - Part 6: Packaged or finished devices — 33 стр.
ISO 2859-1:1999/Amd.1:2011
Действует
Sampling procedures for inspection by attributes -- Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection -- Amendment 1 — 8 стр.
BS EN 62435-1:2017
Действует
Electronic components. Long-term storage of electronic semiconductor devices. General — 38 стр.
IEC 62435-1:2017 ed1.0
Действует
Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General — 65 стр.
IEC 62435-2:2017 ed1.0
Действует
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms — 36 стр.
BS EN 62435-5:2017
Действует
Electronic components. Long-term storage of electronic semiconductor devices. Die and wafer devices — 24 стр.
IEC 60721-3-1:1987 ed1.0
Заменен
Classification of environmental conditions. Part 3: Classification of groups of environmental parameters and their severities. Storage. — 29 стр.