Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors, General and classification, Sensor generals and classification for semiconductor sensors— 14 стр.
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 60749-23:2004 + A1:2011); German version EN 60749-23:2004 + A1:2011— 11 стр.
Letter symbols to be used in electrical technology - Part 2: Telecommunications and electronics (IEC 60027-2:2005); German version EN 60027-2:2007— 92 стр.
Liquid crystal display devices - Part 10-1: Environmental, endurance and mechanical test methods - Mechanical (IEC 61747-10-1:2013); German version EN 61747-10-1:2013— 14 стр.
Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS (IEC 62047-9:2011); German version EN 62047-9:2011— 26 стр.
Industrial systems, installations and equipment and industrial products - Designation of signals - Part 1: Basic rules (IEC 61175-1:2015); German version EN 61175-1:2015— 53 стр.
Standard data element types with associated classification scheme - Part 1: Definitions - Principles and methods (IEC 61360-1:2017); German version EN 61360-1:2017— 181 стр.
