Classification of environmental conditions - Part 3 Classification of groups of environmental parameters and their severities - Section 1: Storage— 42 стр.
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 60749-23:2004 + A1:2011); German version EN 60749-23:2004 + A1:2011— 11 стр.
BS EN 60747-18-2. Semiconductor devices. Part 18-2. Semiconductor bio sensors. Evaluation process of lens-free CMOS photonic array sensor package module— 19 стр.