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IEC 60749-5:2003 ed1.0

Заменен
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test — 13 стр.
Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
ICS
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом