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СтандартыIEC

IEC 60749-5:2003 ed1.0

Заменен
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test — 13 стр.
ОписаниеИзмененияСсылкиВерсии

Ссылочные документы

IEC 60749-5:2017 ed2.0
Заменен
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test — 9 стр.
IEC 60958-3:2003 ed2.0
Заменен
Digital audio interface - Part 3: Consumer applications — 49 стр.

На этот документ ссылаются

DIN EN 62149-2:2010-05
Отменен
Fibre optic active components and devices - Performance standards - Part 2:850 nm discrete vertical cavity surface emitting laser devices (IEC 62149-2:2009); German version EN 62149-2:2009 — 21 стр.
BS EN 60749-4:2002
Заменен
Semiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST) — 12 стр.
BS EN 60749-4:2017
Действует
Semiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST) — 14 стр.
BS IEC 62830-3:2017
Действует
Semiconductor devices. Semiconductor devices for energy harvesting and generation. Vibration based electromagnetic energy harvesting — 22 стр.
BS IEC 60747-14-5:2010
Действует
Semiconductor devices. Semiconductor sensors. PN-junction semiconductor temperature sensor — 20 стр.
BS IEC 60747-14-4:2011
Действует
Semiconductor devices. Discrete devices. Semiconductor accelerometers — 102 стр.
PD IEC/TS 62686-1:2015
Действует
Process management for avionics. Electronic components for aerospace, defence and high performance (ADHP) applications. General requirements for high reliability integrated circuits and discrete semiconductors — 68 стр.
BS EN 62830-3:2017
Действует
Semiconductor devices. Semiconductor devices for energy harvesting and generation. Vibration based electromagnetic energy harvesting — 22 стр.
BS EN IEC 62969-3:2018
Действует
Semiconductor devices. Semiconductor interface for automotive vehicles. Shock driven piezoelectric energy harvesting for automotive vehicle sensors — 30 стр.
18/30368128 DC
Действует
BS IEC 62830-6 Ed.1.0. Semiconductor devices. Semiconductor devices for energy harvesting and generation. Part 6. Test and evaluation methods for vertical contact mode triboelectric energy harvesting devices — 23 стр.
BS EN 62047-5:2011
Действует
Semiconductor devices. Micro-electromechanical devices. RF MEMS switches — 38 стр.
BS EN 60749-30:2005+A1:2011
Действует
Semiconductor devices. Mechanical and climatic test methods. Preconditioning of non-hermetic surface mount devices prior to reliability testing — 16 стр.
BS EN 60749-24:2004
Действует
Semiconductor devices. Mechanical and climatic test methods. Accelerated moisture resistance. Unbiased HAST — 10 стр.
BS EN 60747-15:2012
Действует
Semiconductor devices. Discrete devices. Isolated power semiconductor devices — 28 стр.
IEC 60749-5:2017 ed2.0
Заменен
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test — 9 стр.
IEC PAS 62161:2000 ed1.0
Заменен
Steady state temperature humidity bias life test — 6 стр.