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BS ISO 18118:2004

Заменен
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials — 32 стр.
ОписаниеИзмененияСсылкиВерсии

Ссылочные документы

ASTM E983-94(1999)
Заменен
Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy — 4 стр.
ASTM E995-97
Заменен
Standard Guide for Background Subtraction Techniques in Auger Electron and X-ray Photoelectron Spectroscopy — 4 стр.
ASTM E673-01
Заменен
Standard Terminology Relating to Surface Analysis — 10 стр.
BS ISO 21270:2004
Действует
Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale — 22 стр.
BS ISO 18115-2:2013
Действует
Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy — 54 стр.
BS ISO 18118:2015
Действует
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials — 36 стр.

На этот документ ссылаются

BS ISO 20903:2006
Заменен
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results — 22 стр.
BS ISO 18118:2015
Действует
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials — 36 стр.