Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials— 36 стр.
Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps (Withdrawn 2015)— 6 стр.
Nanotechnologies -- Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis— 34 стр.
Nanotechnologies -- Size distribution and concentration of inorganic nanoparticles in aqueous media via single particle inductively coupled plasma mass spectrometry— 26 стр.
Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis— 22 стр.
Plastics -- Differential scanning calorimetry (DSC) -- Part 6: Determination of oxidation induction time (isothermal OIT) and oxidation induction temperature (dynamic OIT)— 20 стр.
Plastics -- Differential scanning calorimetry (DSC) -- Part 5: Determination of characteristic reaction-curve temperatures and times, enthalpy of reaction and degree of conversion— 16 стр.
Fine ceramics (advanced ceramics, advanced technical ceramics) -- Determination of specific surface area of ceramic powders by gas adsorption using the BET method— 16 стр.
Pore size distribution and porosity of solid materials by mercury porosimetry and gas adsorption. Analysis of mesopores and macropores by gas adsorption— 40 стр.
Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers— 9 стр.
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results— 24 стр.
Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS— 28 стр.
Microbeam analysis. Analytical electron microscopy. Methods for calibrating image magnification by using reference materials with periodic structures— 52 стр.
Workplace air. Determination of metals and metalloids in airborne particulate matter by inductively coupled plasma atomic emission spectrometry. Analysis— 46 стр.
Cleanrooms and associated controlled environments -- Part 15: Assessment of suitability for use of equipment and materials by airborne chemical concentration— 28 стр.
Representation of results of particle size analysis. Calculation of average particle sizes/diameters and moments from particle size distributions— 38 стр.
