DIN 50438-1:1978-01

Отменен

Testing of semi-conductive inorganic materials; determination of impurity content in silicon by infrared absorption, oxygen — 5 стр.

Описание Изменения Ссылки Версии

Ссылочные документы

ASTM F121-83

Заменен

Test Method for Interstitial Atomic Oxygen Content of Silicon by Infrared Absorption — 0 стр.

ASTM F120-88

Отменен

Practices for Determination of the Concentration of Impurities in Single Crystal Semiconductor Materials by Infrared Absorption Spectroscopy (Withdrawn 1993) — 7 стр.

DIN 50438-1:1994-09

Отменен

Testing of materials for semiconductor technology - Determination of impurity content in silicon by infrared absorption - Part 1: Oxygen — 10 стр.

На этот документ ссылаются

DIN 50438-2:1982-08

Отменен

Testing of materials for semiconductor technology; determination of impurty content in silicon by infrared absorption; carbon — 5 стр.

DIN 50438-1:1994-09

Отменен

Testing of materials for semiconductor technology - Determination of impurity content in silicon by infrared absorption - Part 1: Oxygen — 10 стр.

BS EN 50513:2009

Действует

Solar wafers. Data sheet and product information for crystalline silicon wafers for solar cell manufacturing — 36 стр.

ÖVE/ÖNORM EN 50513:2010-02

Действует

Solar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing (english version)