DIN 50444:1984-04

Отменен

Testing of materials for semiconductor technology; conversion between resistivity and dopant density; silicon

На этот документ ссылаются

DIN 50438-3:1984-02

Отменен

Testing of materials for use in semiconductor technology; determination of interstitial atomic boron and phosphorus content of silicon by infrared absorption spectroscopy — 4 стр.

DIN 50438-1:1995-07

Отменен

Testing of materials for semiconductor technology - Determination of impurity content in silicon by infrared absorption - Part 1: Oxygen — 10 стр.

DIN 50438-1:1994-09

Отменен

Testing of materials for semiconductor technology - Determination of impurity content in silicon by infrared absorption - Part 1: Oxygen — 10 стр.