DIN 50449-1:1997-07

Отменен

Testing of materials for semiconductor technology - Determination of impurity content in semiconductors by infrared absorption - Part 1: Carbon in gallium arsenide — 6 стр.

Описание Изменения Ссылки Версии

Ссылочные документы

DIN 50438-1:1995-07

Отменен

Testing of materials for semiconductor technology - Determination of impurity content in silicon by infrared absorption - Part 1: Oxygen — 10 стр.