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DIN EN 61747-1:2000-02

Отменен
Liquid crystal and solid-state display devices - Part 1: Generic specification (IEC 61747-1:1998); German version EN 61747-1:1999 — 23 стр.
ОписаниеИзмененияСсылкиВерсии

Ссылочные документы

DIN 1301-1:1993-12
Отменен
Units; names, symbols — 6 стр.
DIN 1301-1 Beiblatt 1:1982-04
Действует
Units; names and symbols analogous to units — 2 стр.
DIN 1301-2:1978-02
Действует
Units; Submultiples and Multiples for General Use — 11 стр.
DIN 5493-1:1993-02
Отменен
Logarithmic quantities and units; basic concepts, quantities and units of information theory — 4 стр.
DIN 19221:1993-05
Отменен
Control technology; letter symbols — 4 стр.
DIN 41878:1983-06
Отменен
Cases type 8 for semiconductor devices; main dimensions — 2 стр.
DIN 41885:1976-02
Отменен
Cases type 101 for semiconductor devices; main dimensions — 2 стр.
DIN 41886:1974-08
Отменен
Cases types 102 and 103 for semiconductor devices; main dimensions — 2 стр.
DIN 41887:1974-08
Отменен
Cases type 105 for semiconductor devices; main dimensions — 2 стр.
DIN 41888:1976-10
Отменен
Cases type 106 and 107 for semiconductor devices; main dimensions — 2 стр.
DIN 41889:1974-08
Отменен
Case type 108 for semiconductor devices; main dimensions — 2 стр.
DIN EN 28601:1993-02
Отменен
Data elements and interchange formats; information interchange; representation of dates and times (ISO 8601:1988 and its technical corrigendum 1:1991); german version EN 28601:1992 — 14 стр.
DIN EN 60068-1:1995-03
Отменен
Environmental testing - Part 1: General and guidance (IEC 60068-1:1988 + Corrigendum 1988 + A1:1992); German version EN 60068-1:1994 — 18 стр.
DIN EN 60617-12:1999-04
Действует
Graphical symbols for diagrams - Part 12: Binary logic elements (IEC 60617-12:1997); German version EN 60617-12:1998 — 244 стр.
DIN EN 61747-5:1999-02
Действует
Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods (IEC 61747-5:1998); German version EN 61747-5:1998 — 22 стр.
DIN IEC QC 001002:1988-02
Отменен
IEC quality assessment system for electronic components (IECQ); rules of procedure; identical with IEC QC 001002, edition 1986
DIN IEC QC 001002 Beiblatt 1:1988-02
Отменен
Specification structures for the IEC quality assessment system for electronic components (IECQ); identical with IEC Guide 102, edition 1979
DIN IEC 60068-2-59:1993-01
Отменен
Environmental testing; test Fe: vibration, sine-beat method; identical with IEC 60068-2-59:1990
DIN IEC 60747-2:2001-02
Действует
Semiconductor devices - Discrete devices and integrated circuits - Part 2: Rectifier diodes (IEC 60747-2:2000)
DIN IEC 60747-1:1987-03
Отменен
Semiconductor devices; discrete devices and integrated circuits; general; identical with IEC 60747-1, edition 1983
DIN IEC 60747-5:1988-12
Отменен
Semiconductor devices; discrete devices and integrated circuits; optoelectronic devices; identical with IEC 60747-5:1984
DIN ISO 1101 Beiblatt 1:1992-11
Отменен
Technical drawings; geometrical tolerancing; characteristics and symbols; examples of indication and interpretation — 3 стр.
DIN ISO 2859-1:1993-04
Отменен
Sampling procedures for inspection by attributes; sampling plans indexed by acceptable quality level (AQL) for lot-by-lot inspection; identical with ISO 2859-1:1989 — 72 стр.
DIN EN 60749-38:2008-10
Действует
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008); German version EN 60749-38:2008 — 14 стр.
DIN IEC 60068-1:1990-11
Отменен
Electrical engineering; basic environmental testing procedures; general and guidance; identical with IEC 60068-1:1988
BS IEC 60191-1:2007
Заменен
Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of discrete devices — 40 стр.
BS IEC 60191-2:1966
Действует
Mechanical standardization of semiconductor devices. Dimensions — 1052 стр.
DIN IEC 60747-11:1992-04
Действует
Semiconductor devices; sectional specification for semiconductor devices; identical with IEC 60747-11:1985
DIN IEC 60747-10:1987-10
Отменен
Semiconductor devices; generic specification for semiconductor devices and integrated circuits; identical with IEC 60747-10, edition 1984
DIN IEC 60749:1987-09
Отменен
Semiconductor devices; mechanical and climatic test methods; identical with IEC 60749, edition 1984
DIN IEC QC 001002-2:1997-02
Отменен
Rules of procedure of the IEC Quality Assessment System for electronic components (IECQ) - Part 2: Documentation; technology Approval Schedules (IEC QC 001002-2:1995)
DIN ISO 10005:2009-05
Заменен
Quality management systems - Guidelines for quality plans (ISO 10005:2005); Text in German, English and French — 74 стр.
DIN EN ISO 1101:2008-08
Отменен
Geometrical Product Specifications (GPS) - Geometrical tolerancing - Tolerances of form, orientation, location and run-out (ISO 1101:2004); German version EN ISO 1101:2005 — 66 стр.
DIN ISO 8601:2006-09
Отменен
Data elements and interchange formats - Information interchange - Representation of dates and times (ISO 8601:2004) — 44 стр.
DIN EN 61747-1:2003-12
Действует
Liquid crystal and solid-state display devices - Part 1: Generic specification (IEC 61747-1:1998 + A1:2003); German version EN 61747-1:1999 + A1:2003 — 45 стр.
DIN EN 120000:1996-09
Отменен
Generic specification: Semiconductor optoelectronic and liquid crystal devices; English version EN 120000:1996 — 272 стр.

На этот документ ссылаются

DIN EN 61747-3-1:2000-07
Отменен
Liquid crystal and solid-state display devices - Part 3-1: Liquid crystal display (LCD) cells; blank detail specification (IEC 61747-3-1:1998); German version EN 61747-3-1:1999 — 8 стр.
DIN EN 61747-1:2003-12
Действует
Liquid crystal and solid-state display devices - Part 1: Generic specification (IEC 61747-1:1998 + A1:2003); German version EN 61747-1:1999 + A1:2003 — 45 стр.
DIN EN 61747-3:2000-07
Отменен
Liquid crystal and solid-state display devices - Part 3: Sectional specification for liquid crystal display (LCD) cells (IEC 61747-3:1998); German version EN 61747-3:1999 — 11 стр.
DIN EN 120000:1996-09
Отменен
Generic specification: Semiconductor optoelectronic and liquid crystal devices; English version EN 120000:1996 — 272 стр.