Каталог стандартов

+7 (495) 223-46-76 +7 (812) 309-78-59
inform@normdocs.ru

DIN 50435:1988-05

Отменен
Testing of semiconductor materials; determination of the radial resistivity variation of silicon or germanium slices by means of the four-probe/direct current method — 3 стр.
ICS
29.045 Semiconducting materials / Полупроводниковые материалы