Testing of semiconductor materials; determination of the radial resistivity variation of silicon or germanium slices by means of the four-probe/direct current method— 3 стр.
Testing of semiconductor materials; measurement of the resistivity of silicon or germanium single crystals by means of the four probe/direct current method with collinear array— 5 стр.
Testing of semiconductive inorganic materials; determination of the radial resistivity variation of silicon or germanium slices, by means of a four-point-DC-probe— 3 стр.
Testing of semiconductive inorganic materials; determination of the radial resistivity variation of silicon or germanium slices, by means of a four-point-DC-probe— 3 стр.
