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DIN EN 60749-44:2017-04

Действует
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (IEC 60749-44:2016); German version EN 60749-44:2016 — 22 стр.
ОписаниеИзмененияСсылкиВерсии

Ссылочные документы

IEC 62396-5:2014 ed1.0
Действует
Process management for avionics - Atmospheric radiation effects - Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systems — 21 стр.
IEC 62396-4:2013 ed1.0
Действует
Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects — 18 стр.
IEC 60749-38:2008 ed1.0
Действует
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory — 26 стр.
DIN EN 60749-44:2014-08
Отменен
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (IEC 47/2193/CD:2014)