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DIN 50451-2:1990-10

Отменен
Determination of cobalt, chromium, copper, iron and nickel as impurities in hydrofluoric acid for use in semiconductor technology by plasma-induced emission spectrometry — 2 стр.
ОписаниеИзмененияСсылкиВерсии

Ссылочные документы

DIN 8120-1:1981-07
Отменен
Weighing machines; terms and definitions — 10 стр.
DIN 12650-2:1981-10
Отменен
Mechanical, physical and electrical laboratory apparatus - Piston operated volumetric apparatus - Piston pipettes — 2 стр.
DIN 12664-1:1983-08
Отменен
Laboratory glassware; one-mark volumetric flasks; volumetric flasks with flanged edge, conical socket and conical joint — 4 стр.
DIN 51401-1:1983-12
Отменен
Atomic absorption spectrometry; terms — 14 стр.
DIN 50451-2:2003-04
Действует
Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 2: Calcium (Ca), cobalt (Co), chromium (Cr), copper (Cu), Iron (Fe), nickel (Ni) and zinc (Zn) in hydrofluoric acid with plasma-induced emission spectroscopy — 8 стр.

На этот документ ссылаются

DIN 50451-2:2003-04
Действует
Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 2: Calcium (Ca), cobalt (Co), chromium (Cr), copper (Cu), Iron (Fe), nickel (Ni) and zinc (Zn) in hydrofluoric acid with plasma-induced emission spectroscopy — 8 стр.
DIN 50456-2:1995-04
Отменен
Testing of materials for semiconductor technology - Method for the characterisation of moulding compounds for electronic components - Part 2: Determination of ionic impurities using pressure cooker test — 2 стр.