DIN 50449-2:1998-01

Отменен

Testing of materials for semiconductor technology - Determination of impurity content in semiconductors by infrared absorption - Part 2: Boron in gallium arsenide — 4 стр.

Описание Изменения Ссылки Версии

Ссылочные документы

DIN 50438-1:1995-07

Отменен

Testing of materials for semiconductor technology - Determination of impurity content in silicon by infrared absorption - Part 1: Oxygen — 10 стр.