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DIN 50440-1:1981-11

Отменен
Testing of materials for semiconductor technology; measurement of recombination carrier lifetime in silicon single crystals by means of photo conductive decay method; measurement on bar-shaped specimens — 5 стр.
ОписаниеИзмененияСсылкиВерсии

Ссылочные документы

DIN 19226-6:1997-09
Отменен
Control technology - Part 6: Terms and definitions of functional and constructional units — 21 стр.
DIN 41852:1978-08
Отменен
Semiconductor engineering; terms and definitions — 14 стр.
DIN 50440:1998-11
Отменен
Testing of materials for semiconductor technology - Measurement of carrier lifetime in silicon single crystals - Recombination carrier lifetime at low injection by photoconductivity method — 8 стр.

На этот документ ссылаются

DIN 50440:1998-11
Отменен
Testing of materials for semiconductor technology - Measurement of carrier lifetime in silicon single crystals - Recombination carrier lifetime at low injection by photoconductivity method — 8 стр.