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DIN 51096:2008-07

Отменен
Testing of ceramic raw and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) and electrothermal vaporisation (ETV) — 26 стр.
ОписаниеИзмененияСсылкиВерсии

Ссылочные документы

DIN 1319-3:1996-05
Действует
Fundamentals of metrology - Part 3: Evaluation of measurements of a single measurand, measurement uncertainty — 24 стр.
DIN 1319-4:1999-02
Действует
Fundamentals of metrology - Part 4: Evaluation of measurements; uncertainty of measurement — 36 стр.
DIN 1333:1992-02
Действует
Presentation of numerical data — 20 стр.
DIN 32645:2008-11
Действует
Chemical analysis - Decision limit, detection limit and determination limit under repeatability conditions - Terms, methods, evaluation — 28 стр.
DIN 51061-2:2004-07
Отменен
Testing of ceramic raw and finished materials - Part 2: Sampling of ceramic raw materials — 14 стр.
DIN 51701-2:2006-09
Действует
Testing of solid fuels - Sampling and sample preparation - Part 2: Sampling — 23 стр.
DIN 51940:1992-10
Отменен
Testing of carbon materials; sampling and sample preparation; solid materials, solid binders and impregnants — 6 стр.
DIN EN 15991:2011-04
Отменен
Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV); German version EN 15991:2011 — 28 стр.

На этот документ ссылаются

DIN 5109:1976-12
Отменен
Joiner's hammers — 2 стр.
DIN EN 15991:2011-04
Отменен
Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV); German version EN 15991:2011 — 28 стр.