DIN EN 60749-4:2017-11

Действует

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (IEC 60749-4:2017); German version EN 60749-4:2017 — 12 стр.

Описание Изменения Ссылки Версии

Ссылочные документы

IEC 60749-5:2017 ed2.0

Заменен

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test — 9 стр.

DIN EN 60749-4:2016-06

Отменен

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

DIN EN 60749-4:2003-04

Отменен

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (IEC 60749-4:2002); German version EN 60749-4:2002 — 9 стр.

На этот документ ссылаются

DIN EN 60749-4:2003-04

Отменен

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (IEC 60749-4:2002); German version EN 60749-4:2002 — 9 стр.