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IEC 60749-1:2002 ed1.0

Действует
Semiconductor devices - Mechanical and climatic test methods - Part 1: General — 15 стр.
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.
ICS
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом