IEC 60749-1:2002 ed1.0

Действует

Semiconductor devices - Mechanical and climatic test methods - Part 1: General — 15 стр.

Ссылочные документы

Заменен

Semiconductor devices - Mechanical and climatic test methods — 151 стр.

Заменен

Amendment 2 - Semiconductor devices - Mechanical and climatic test methods — 63 стр.

Заменен

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods — 21 стр.

Заменен

Semiconductor devices - Mechanical and climatic test methods — 95 стр.

Действует

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General — 0 стр.

Действует

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General — 0 стр.