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IEC 60749-35:2006 ed1.0

Действует
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components — 43 стр.
Defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components. Provides a guide to the use of acoustic microscopy for detecting anomalies (delamination, cracks, mould-compound voids, etc.) reproducibly and non-destructively in plastic packages.
ICS
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом