IEC 60749-4:2002 ed1.0

Заменен

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) — 15 стр.

Описание Изменения Ссылки Версии

Ссылочные документы

IEC 60749-4:2017 ed2.0

Действует

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) — 9 стр.

IEC PAS 62177:2000 ed1.0

Заменен

Highly-accelerated temperature and humidity stress test (HAST) — 8 стр.

IEC 60749-4:2002/COR1:2003 ed1.0

Заменен

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) — 0 стр.

На этот документ ссылаются

IEC 60749-4:2017 ed2.0

Действует

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) — 9 стр.

IEC 60749-4:2002/COR1:2003 ed1.0

Заменен

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) — 0 стр.

IEC PAS 62177:2000 ed1.0

Заменен

Highly-accelerated temperature and humidity stress test (HAST) — 8 стр.