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IEC 60749-6:2002 ed1.0

Заменен
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature — 7 стр.
Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive. The contents of the corrigendum of August 2003 have been included in this copy.
ICS
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом