Каталог стандартов

+7 (495) 223-46-76 +7 (812) 309-78-59
inform@normdocs.ru

IEC 60749-8:2002 ed1.0

Действует
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing — 31 стр.
Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices. The contents of the corrigenda of April 2003 and August 2003 have been included in this copy.
ICS
31.080.01 Semiconductor devices in general / Полупроводниковые приборы в целом