Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects— 18 стр.
Process management for avionics - Atmospheric radiation effects - Part 4: Guidelines for designing with high voltage aircraft electronics and potential single event effects— 16 стр.
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (IEC 60749-44:2016); German version EN 60749-44:2016— 22 стр.
Process management for avionics - Atmospheric radiation effects - Part 4: Guidelines for designing with high voltage aircraft electronics and potential single event effects— 16 стр.
